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PDF K4A4G165WD Data sheet ( Hoja de datos )

Número de pieza K4A4G165WD
Descripción 4Gb D-die DDR4 SDRAM
Fabricantes Samsung 
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Rev. 0.5, Feb. 2014
K4A4G165WD
Preliminary
4Gb D-die DDR4 SDRAM x16 only
96FBGA with Lead-Free & Halogen-Free
(RoHS compliant)
1.2V
CAUTION :
This document includes some items still under discussion in JEDEC.
Therefore, those may be changed without pre-notice based on JEDEC progress.
In addition, it is highly recommended that you not send specs without Samsung’s permission.
datasheet
SAMSUNG ELECTRONICS RESERVES THE RIGHT TO CHANGE PRODUCTS, INFORMATION AND
SPECIFICATIONS WITHOUT NOTICE.
Products and specifications discussed herein are for reference purposes only. All information discussed
herein is provided on an "AS IS" basis, without warranties of any kind.
This document and all information discussed herein remain the sole and exclusive property of Samsung
Electronics. No license of any patent, copyright, mask work, trademark or any other intellectual property
right is granted by one party to the other party under this document, by implication, estoppel or other-
wise.
Samsung products are not intended for use in life support, critical care, medical, safety equipment, or
similar applications where product failure could result in loss of life or personal or physical harm, or any
military or defense application, or any governmental procurement to which special terms or provisions
may apply.
For updates or additional information about Samsung products, contact your nearest Samsung office.
All brand names, trademarks and registered trademarks belong to their respective owners.
(C) 2014 Samsung Electronics Co., Ltd. All rights reserved.
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1 page




K4A4G165WD pdf
K4A4G165WD
datasheet
3. Package pinout/Mechanical Dimension & Addressing
3.1 x16 Package Pinout (Top view) : 96ball FBGA Package
Preliminary Rev. 0.5
DDR4 SDRAM
1
2
3 456 7
8
9
A
VDDQ
VSSQ
DQU0
B VPP VSS VDD
C
VDDQ
DQU4
DQU2
D
VDD
VSSQ
DQU6
E
VSS
DMU_n/
DBIU_n
VSSQ
F
VSSQ
VDDQ DQSL_c
G
VDDQ
DQL0 DQSL_t
H
VSSQ
DQL4
DQL2
J
VDD
VDDQ
DQL6
K VSS CKE ODT
L
VDD
WE_n/
A14
ACT_n
M VREFCA BG0
A10/AP
N VSS BA0
A4
P RESET_n
A6
A0
R VDD
A8
A2
T VSS A11 PAR
DQSU_c
DQSU_t
DQU3
DQU7
DML_n
DBIL_n
DQL1
VDD
DQL3
DQL7
CK_t
VSSQ
DQU1
DQU5
VSSQ
VSSQ
VDDQ
VSS
DQL5
VDDQ
CK_c
VDDQ
VDD
VSSQ
VDDQ
VSS
ZQ
VDDQ
VSSQ
VDD
VSS
CS_n
RAS_n
VDD
A12/BC_n
A3
A1
A9
NC
CAS_n
BA1
A5
A7
A13
VSS
TEN
ALERT_n
VPP
VDD
A
B
C
D
E
F
G
H
J
K
L
M
N
P
R
T
Ball Locations (x16)
Populated ball
Ball not populated
Top view
(See the balls through the package)
123456789
A
B
C
D
E
F
G
H
J
K
L
M
N
P
R
T
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K4A4G165WD arduino
K4A4G165WD
datasheet
Preliminary Rev. 0.5
DDR4 SDRAM
8. AC & DC Input Measurement Levels
8.1 AC & DC Logic input levels for single-ended signals
[ Table 6 ] Single-ended AC & DC input levels for Command and Address
Symbol
Parameter
DDR4-1600/1866/2133/2400
Min.
Max.
VIH.CA(DC75)
DC input logic high
VREFCA+ 0.075
VDD
VIL.CA(DC75)
DC input logic low
VSS VREFCA-0.075
VIH.CA(AC100)
AC input logic high
VREF + 0.1
Note 2
VIL.CA(AC100)
AC input logic low
Note 2
VREF - 0.1
VREFCA(DC)
Reference Voltage for ADD, CMD inputs
0.49*VDD
0.51*VDD
NOTE :
1. See “Overshoot and Undershoot Specifications” .
2. The AC peak noise on VREFCA may not allow VREFCA to deviate from VREFCA(DC) by more than ± 1% VDD (for reference : approx. ± 12mV)
3. For reference : approx. VDD/2 ± 12mV
Unit NOTE
V
V
V1
V1
V 2,3
8.2 VREF Tolerances
The dc-tolerance limits and ac-noise limits for the reference voltages VREFCA is illustrated in Figure 1. It shows a valid reference voltage VREF(t) as a func-
tion of time. (VREF stands for VREFCA and VREFDQ likewise).
VREF(DC) is the linear average of VREF(t) over a very long period of time (e.g. 1 sec). This average has to meet the min/max requirement in Table 6 on
page 12. Furthermore VREF(t) may temporarily deviate from VREF(DC) by no more than ± 1% VDD.
voltage
VDD
VSS
Figure 1. Illustration of VREF(DC) tolerance and VREF ac-noise limits
time
The voltage levels for setup and hold time measurements VIH(AC), VIH(DC), VIL(AC) and VIL(DC) are dependent on VREF.
"VREF" shall be understood as VREF(DC), as defined in Figure 1 .
This clarifies, that dc-variations of VREF affect the absolute voltage a signal has to reach to achieve a valid high or low level and therefore the time to
which setup and hold is measured. System timing and voltage budgets need to account for VREF(DC) deviations from the optimum position within the
data-eye of the input signals.
This also clarifies that the DRAM setup/hold specification and derating values need to include time and voltage associated with VREF ac-noise. Timing
and voltage effects due to ac-noise on VREF up to the specified limit (+/-1% of VDD) are included in DRAM timings and their associated deratings.
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