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PDF TPC8124 Data sheet ( Hoja de datos )

Número de pieza TPC8124
Descripción Field Effect Transistor Silicon P Channel MOS Type
Fabricantes Toshiba Semiconductor 
Logotipo Toshiba Semiconductor Logotipo



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No Preview Available ! TPC8124 Hoja de datos, Descripción, Manual

TPC8124
TOSHIBA Field Effect Transistor Silicon P Channel MOS Type (U-MOwwSw.D)ataSheet4U.com
TPC8124
Lithium Ion Battery Applications
Power Management Switch Applications
Unit: mm
Small footprint due to small and thin package
Low drain-source ON-resistance: RDS (ON) = 6.1 mΩ (typ.)
Low leakage current: IDSS = 10 μA (max) (VDS = 40 V)
Enhancement mode: Vth = 0.8 to 2.0 V (VDS = 10 V, ID = 0.5mA)
Absolute Maximum Ratings (Ta = 25°C)
Characteristics
Symbol
Drain-source voltage
Drain-gate voltage (RGS = 20 kΩ)
Gate-source voltage
Drain current
DC (Note 1)
Pulse (Note 1)
Drain power dissipation (t = 10 s)
(Note 2a)
Drain power dissipation (t = 10 s)
(Note 2b)
Single pulse avalanche energy
(Note 3)
Avalanche current
(Note 1)
Channel temperature
Storage temperature range
VDSS
VDGR
VGSS
ID
IDP
PD
PD
EAS
IAR
Tch
Tstg
Note 1, Note 2, Note 3 : See the next page.
Rating
40
40
25/+20
12
48
1.9
1.0
134
12
150
55 to 150
Unit
V
V
V
A
W
W
mJ
A
°C
°C
JEDEC
JEITA
TOSHIBA
2-6J1B
Weight: 0.080 g (typ.)
Circuit Configuration
8765
Using continuously under heavy loads (e.g. the application of high
temperature/current/voltage and the significant change in temperature,
etc.) may cause this product to decrease in the reliability significantly
even if the operating conditions (i.e. operating
1234
temperature/current/voltage, etc.) are within the absolute maximum
ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling
Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report and estimated
failure rate, etc).
This transistor is an electrostatic-sensitive device. Handle with care.
1 2009-11-16

1 page




TPC8124 pdf
RDS (ON) – Ta
20
Common source
Pulse test
15
10
VGS = −4 .5V
5
VGS = −10 V
ID = −3, 6, 12 A
ID = −3, 6, 12 A
0
80 40
0
40 80 120 160
Ambient temperature Ta (°C)
100
10
10
TPC8124
www.DataSheet4U.com
IDR – VDS
4.5
3
1
0.1
0
1 VGS = 0 V
Common source
Ta = 25°C
Pulse test
0.2 0.4 0.6 0.8 1 1.2
Drainsource voltage VDS (V)
10000
Capacitance – VDS
Ciss
1000
Common source
VGS = 0 V
f = 1 MHz
Ta = 25°C
100
0.1
1
Coss
Crss
10 100
Drainsource voltage VDS (V)
Vth – Ta
2
1.6
1.2
0.8
0.4
Common source
VDS = −10 V
ID = −0.5mA
Pulse test
0
80 40
0
40 80 120
Ambient temperature Ta (°C)
160
2
(1)
1.6
1.2
(2)
0.8
PD – Ta
(1)Device mounted on a glass-epoxy
board(a) (Note 2a)
(2)Device mounted on a glass-epoxy
board(b) (Note 2b)
t = 10 s
0.4
0
0 40 80 120 160
Ambient temperature Ta (°C)
Dynamic input/output
characteristics
40
20
VDD = 32 V
30
VDS
20
16
10 8
VGS
15
8
VDD = 32 V
16
10
Common source
ID = −12 A
Ta = 25°C
Pulse test
5
00
0 40 80 120 160
Total gate charge Qg (nC)
5 2009-11-16

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