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PDF MFT-G240160DPEW-1W Data sheet ( Hoja de datos )
| Número de pieza | MFT-G240160DPEW-1W | |
| Descripción | LCD Module | |
| Fabricantes | Truly | |
| Logotipo |  |
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Hay una vista previa y un enlace de descarga de MFT-G240160DPEW-1W (archivo pdf) en la parte inferior de esta página. Total 17 Páginas | ||
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LCD MODULE MFT-G240160DPEW-1W Version : 1.0 Mar 08,2000
www.DataSheet4U.com
PRODUCT SPECIFICATIONS
PHYSICAL DATA
EXTERNAL DIMENSIONS
BLOCK DIAGRAM
ABSOLUTE MAXIMUM RATINGS
ELECTRICAL CHARACTERISTICS
TIMING CHART OF INPUT SIGNALS
DISPLAY DATA PATTERN
TIMING OF POWER SUPPLY
EXAMPLE OF POWER CONNECTION
ELECTRO-OPTICAL CHARACTERISTICS
INTERFACE PIN CONNECTIONS
PART LIST
MODULE PACKAGE
RELIABILITY
QUALITY GUARANTEE
INSPECTION CRITERIA
PRECAUTIONS FOR USING LCD MODULES
USING LCD MODULES
TRULY SEMICONDUCTORS LTD.
P.1 of 17
1 page  
LCD MODULE MFT-G240160DPEW-1W Version : 1.0
Item
CL1 pulse width ᦠ”
Clock cycle time
CL2 pulse width
Clock set up time
Clock hole time
Clock rise/fall time
Data set up time
Data hold time
' M ' set up time
' M ' hold time
Symbol Min Typ Max Unit
tW 23 --- --- ns
fCP 71 --- --- ns
tWC 23 --- --- ns
tLSU 25 --- --- ns
tLC 25 --- --- ns
tr , tf --- --- 50 ns
tDSU 10 --- --- ns
tDHD 20 --- --- ns
tSETUP
25
---
---
ns
tHOLD 25 --- --- ns
Mar 08,2000
www.DataSheet4U.com
CL2
fCP
tW tW
tf
0.8VDD
0.2VDD
tr
tW
D0~D3
0.8VDD
0.2VDD
tDSU
tDHD
(Segment Mode 1)
CL1
M
tLSU
tLC
0.8VDD
0.2VDD
tr tWC tf
tSETUP
tHOLD
0.8VDD
0.2VDD
TRULY SEMICONDUCTORS LTD.
P.5 of 17
5 Page 
LCD MODULE MFT-G240160DPEW-1W Version : 1.0 Mar 08,2000
RELIABILITY
N Content of Reliability Test
No. Test Item
Environmental Test
Content of Test
Test Condition
1 High temperature
storage
2 Low temperature
storage
3 High temperature
operation
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4 Low temperature
operation
5 High temperature /
Humidity storage
6 High temperature /
Humidity operation
7 Temperature cycle
Endurance test applying the high storage
temperature for a long time.
Endurance test applying the low storage
temperature for a long time.
Endurance test applying the electric stress
(Voltage & Current) and the thermal stress to
the element for a long time.
Endurance test applying the electric stress
under low temperature for a long time.
Endurance test applying the high temperature
and high humidity storage for a long time.
Endurance test applying the electric stress
(Voltage & Current) and temperature / humidity
stress to the element for a long time.
Endurance test applying the low and high
temperature cycle.
-20°C
30min
25°C
5min.
70°C
30min
80 °C
200 hrs
-30 °C
200 hrs
70 °C
200 hrs
-20 °C
200 hrs
80 °C , 90 %RH
96 hrs
70 °C , 90 %RH
96 hrs
-20°C / 70°C
10 cycles
Applicable
Standard
------
------
------
------
MIL-202E-103B
JIS-C5023
MIL-202E-103B
JIS-C5023
------
1 cycle
Mechanical Test
8 Vibration test
Endurance test applying the vibration during
transportation and using.
10∼22Hz → 1.5mmp-p
22∼500Hz → 1.5G
Total 0.5hrs
9 Shock test
Constructional and mechanical endurance test 50G half sign
applying the shock during transportation.
wave 1l msedc
3 times of each direction
10 Atmospheric
Endurance test applying the atmospheric
115 mbar
pressure test
pressure during transportation by air.
40 hrs
Others
11 Static electricity test Endurance test applying the electric stress to
the terminal.
VS=800V , RS=1.5 kΩ
CS=100 pF
1 time
∗∗∗ Supply voltage for logic system = VDD. Supply voltage for LCD system = Operating voltage at 25°C.
MIL-202E-201A
JIS-C5025
JIS-C7022-A-10
MIL-202E-213B
MIL-202E-105C
MIL-883B-3015.1
N Failure Judgement Criterion
Criterion Item
123
Basic specification
Electrical characteristic
Mechanical characterstic
Optical characterstic
Test Item No.
45678
Failure Judgment Criterion
9 10 11
Out of the Basic Specification
Out of the DC and AC Characterstic
Out of the Mechanical Specification Color
change : Out of Limit Apperance Specification
Out of the Apperance Standard
TRULY SEMICONDUCTORS LTD.
P.11 of 17
11 Page | ||
| Páginas | Total 17 Páginas | |
| PDF Descargar | [ Datasheet MFT-G240160DPEW-1W.PDF ] | |
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