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PDF 2DEA Data sheet ( Hoja de datos )

Número de pieza 2DEA
Descripción Integrated ESD Protection Diode Array
Fabricantes Bourns Electronic 
Logotipo Bourns Electronic Logotipo



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Features
Lead free
RoHS compliant*
Supports 15 KV IEC 61000-4-2 ESD
equipment specification*
Single device protects as many as 20 lines
on exposed pins, communications ports
Incorporates 40 bi-directional PN
junction diodes
Small form factor replaces 20 SOT23
packages
Thin Film on Silicon 2DEA Integrated ESD Protection Diode Array
General Information
The Model 2DEA Series is well-suited for space constrained
designs where the requirements of international ESD standard
specification IEC 61000-4-2 must be met.
These highly integrated PN junction diode arrays are espe-
cially effective for use in PC notebooks and motherboards,
engineering workstations and portable battery-powered
devices such as PDAs and cellular phones.
Space savings, as compared to popular BA V99 SOT23
based implementations, can yield a 75 % reduction in
utilized board area. In addition, significant assembly cost
reductions and manufacturing integrity improvements can
be realized.
Two package options are available. Model 2DEA consists of
20 bi-directional diode pairs in a miniature 24-pin JEDEC
QSOP package. The 2DEB consists of 17 bi-directional
diode pairs in a traditional wide-body SOIC JEDEC package.
www.DataSheet4U.com
Package Schematic
VDD VSS
24 23 22 21 20 19 18 17 16 15 14 13
1 2 3 4 5 6 7 8 9 10 11 12
VSS VDD
Electrical & Environmental Characteristics
Electrical Characteristics
Supply Voltage
Voltage @ any Channel
Channel Clamp Current (continuous)
Forward Voltage:
@If = 1 mA
@If = 12 mA
Leakage Current @ VSS<Vin<VDD = 12 V
Diode Capacitance
Environmental Characteristics
Operating Temperature
Storage Temperature
Diode Power Rating
ESD Performance Withstand*:
Contact Discharge
Air Discharge
Symbol
VDD - VSS
Vin
IC
Vf
Minimum
-0.3
-0.3
TJ -55
Tstg -65
±8
±15
Nominal
0.8
0.1
20
±9
±16
Maximum
12
VDD + 0.5
±15
0.9
1.5
10
5
+125
+150
Unit
V
V
mA
V
V
µA
pF
°C
°C
mW/diode
kV
kV
* Note: IEC 61000-4-2 ESD test performance is measured at the systems level and system designs, enclosure shielding and other conventional ESD control measures usually influence
the results of these tests. Testing on the component level serves as an indicator that the system passes a specific compliance step, but does not ensure that the system passes at that
level. The Model 2DEA/DEB device, therefore, can support successful implementation of the IEC 61000-4-2 system level ESD standard.
*RoHS Directive 2002/95/EC Jan 27 2003 including Annex
Specifications are subject to change without notice.
Customers should verify actual device performance in their specific applications.

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