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PDF AS4LC2M8S0 Data sheet ( Hoja de datos )

Número de pieza AS4LC2M8S0
Descripción (AS4LCxMxxSx) 3.3V 2M X 8/1M X 16 CMOS synchronous DRAM
Fabricantes Alliance Semiconductor 
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May 2001
AS4LC2M8S1
Preliminary
AS4LC2M8S0
® AS4LC1M16S1
3.3V 2M × 8/1M × 16 CMOS synchronous DRAM
AS4LC1M16S0
Features
• Organization
- 1,048,576 words × 8 bits × 2 banks (2M × 8)
11 row, 9 column address
- 524,288 words × 16 bits × 2 banks (1M × 16)
11 row, 8 column address
• All signals referenced to positive edge of clock, fully
synchronous
• Dual internal banks controlled by A11 (bank select)
• High speed
- 143/125/100 MHz
- 7/8/10 ns clock access time
• Low power consumption
- Active: 576 mW max
- Standby: 7.2 mW max, CMOS I/O
• 2048 refresh cycles, 32 ms refresh interval
• 4096 refresh cycles, 64 ms refresh interval
• Auto refresh and self refresh
• PC100 functionality
• Automatic and direct precharge including concurrent
autoprecharge
• Burst read, write/Single write
• Random column address assertion in every cycle, pipelined
operation
• LVTTL compatible I/O
• 3.3V power supply
• JEDEC standard package, pinout and function
- 400 mil, 44-pin TSOP 2 (2M × 8)
- 400 mil, 50-pin TSOP 2 (1M × 16)
• Read/write data masking
• Programmable burst length (1/2/4/8/ full page)
• Programmable burst sequence (sequential/interleaved)
• Programmable CAS latency (1/2/3)
Pin arrangement
VCC
DQ0
VSSQ
DQ1
VCCQ
DQ2
VSSQ
DQ3
VCCQ
NC
NC
WE
CAS
RAS
CS
A11
A10
A0
A1
A2
A3
VCC
TSOP 2
1 44
2 43
3 42
4 41
5 40
6 39
7 38
8 37
9 36
10 35
11 34
12 33
13 32
14 31
15 30
16 29
17 28
18 27
19 26
20 25
21 24
22 23
LEGEND
Configuration
Refresh Count
Row Address
Bank Address
Column Address
Selection guide
VSS
DQ7
VSSQ
DQ6
VCCQ
DQ5
VSSQ
DQ4
VCCQ
NC
NC
DQM
CLK
CKE
NC
A9
A8
A7
A6
A5
A4
VSS
VCC
DQ0
DQ1
VSSQ
DQ2
DQ3
VCCQ
DQ4
DQ5
VSSQ
DQ6
DQ7
VCCQ
LDQM
WE
CAS
RAS
CS
A11
A10
A0
A1
A2
A3
VCC
2M × 8
1M × 8 × 2 banks
2K/4K
(A0 – A10)
2 (BA)
512 (A0 – A8)
Pin designation
TSOP 2
1 50
VSS
Pin(s)
2 49 DQ15
3 48 DQ14
4 47 VSSQ
DQM (2M × 8)
UDQM/LDQM (1M × 16)
5 46 DQ13
6 45 DQ12
7 44 VCCQ
8 43 DQ11
A0 to A10
9
10
42
41
DDVaSQSQ1t0aSheet4U.com
11 40 DQ9
A11
12 39 DQ8
13 38 VCCQ
DQ0 to DQ7 (2M × 8)
14 37 NC
15 36 UDQM
DQ0 to DQ15 (1M × 16)
16 35 CLK
17 34 CKE
RAS
18 33 NC
19 32 A9
CAS
20 31 A8
21 30 A7
WE
22 29 A6
23 28 A5
CS
24 27 A4
25 26 VSS
VCC, VCCQ
1M × 16
512K × 16 × 2 banks
2K/4K
VSS, VSSQ
CLK
(A0 – A10)
2 (BA)
CKE
256 (A0 – A7)
Symbol
–7
–8
Description
Output disable/write mask
Address inputs CAR0A–07–(1×01D6a)taShee
CA0 – 8 (×8)
Bank address (BA)
Input/output
Row address strobe
Column address strobe
Write enable
Chip select
Power (3.3V ± 0.3V)
Ground
Clock input
Clock enable
–10 Unit
Bus frequency (CL = 3)
fMax 143 125 100 MHz
Maximum clock access time (CL = 3)
tAC 5.5
6
6 ns
Minimum input setup time
tS 2 2 2 ns
Minimum input hold time
tH 1.0 1.0 1.0 ns
Row cycle time (CL = 3, BL = 1)
tRC 70 80 80 ns
Maximum operating current ([×16], RD or
WR, CL = 3), BL = 2
ICC1
130
100
100 mA
DataSheet4UM.caoximmum CMOS standby current, self refresh
ICC6
1
1
1 mA
5/21/01; v.1.1
DataSheet4 U .com
Alliance Semiconductor
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AS4LC2M8S0 pdf
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Mode register fields
Address
Function
RFU = 0 during MRS cycle.
Write burst length
A9 Length
0
Programmed
burst length
1 Single burst
AS4LC2M8S1
AS4LC1M16S1
®
Register programmed with MRS
A11~A10 A9 A8 A7 A6 A5 A4 A3 A2 A1 A0
RFUWBL
TM
CAS latency
BT Burst length
Burst type
A3 Type
0 Sequential
1 Interleaved
A8
0
0
1
1
heet4U.com
A6
0
0
0
0
1
Test mode
A7 Type
0 Mode register set
1 Reserved
0 Reserved
1 Reserved
CAS latency
A5 A4 Latency
0 0 Reserved
01
1
10
2
11
3
X X Reserved
Burst sequence (burst length = 4)
Initial address
A1 A0
0 00
0 11
1 02
1 13
Burst sequence (burst length = 8)
Initial address
A2 A1 A0
0 0 00
0 0 11
0 1 02
0 1 13
1 0 04
1 0 15
1 1 06
1 1 17
DataSheet4U.com
1
2
3
4
5
6
7
0
A2
D a t a S h e e t 4 U0. c o m
0
0
0
1
1
1
1
Sequential
12
23
30
01
3
0
1
2
Sequential
234567
345670
456701
567012
670123
701234
012345
123456
Burst length
A1 A0 BT = 0 BT = 1
0 0 11
0 1 22
1 0 44
1 1 88
0 0 Reserved Reserved
0 1 Reserved Reserved
1 0 Reserved Reserved
1 1 Full page Reserved
Interleave
0123
1032
2301
3210
Interleave
01234567
10325476
23016745
32107654
45670123
54761032
67452301
76543210
DataSh
5/21/01; v.1.1
D a t a S h e4eUt . c o m
Alliance Semiconductor
P. 5 of 29

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AS4LC2M8S1
AS4LC1M16S1
®
Command
Pin settings
Description
Use the Burst Write command to write data into the SDRAM on
Burst write
CS = CAS = WE = A10 = low;
RAS = high; A0~A9 = column
address; (A9 = don’t care for
2M × 8; A8, A9 = don’t care
for 1M × 16)
consecutive clock cycles to adjacent column addresses. The burst
length and addressing mode is determined by the mode register
opcode. Input the initial write address in the same clock cycle as the
Burst Write command. Burst terminate behavior for write is the same
as that for read. Terminate the burst with a burst stop command,
precharge command to the same bank or another burst read/write.
DQM can also be used to mask the input data.
UDQM/LDQM (×16)
DQM (×8) operation
Use DQM to mask input and output data. It disables the output buffers
in a read operation and masks input data in a write operation. The
output data is invalid 2 clocks after DQM assertion (2 clock latency).
Input data is masked on the same clock as DQM assertion (0 clock
latency).
Burst stop
CS = WE = low; RAS = CAS = Use burst stop to terminate burst operation. This command may be
high used to terminate all legal burst lengths.
The Bank Precharge command precharges the bank specified by A11.
CS = A10 = RAS = WE = low; The precharged bank is switched from active to idle state and is ready
Bank precharge
Precharge all
CAS = high; A11 = bank to be activated again. Assert the precharge command after tRAS(min) of
select; A0~A9 = don’t care the bank activate command in the specified bank. The precharge
operation requires a time of tRP(min) to complete.
CS =
A10
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both banks simultaneously.
on precharge completion.
During auto precharge, the SDRAM adjusts internal timing to satisfy
Auto precharge
Write: CS = CAS = WE = low ;
Read: CS = CAS = low;
A10 = high; A11 = bank select;
A0~A9 = column address;
(A9 = don’t care for 2M × 8; A8,
A9 = don’t care for 1M × 16)
tRAS(min) and tRP for the programmed CAS latency and burst length.
Couple the auto precharge with a burst read/write operation by
asserting A10 to a high state at the same time the burst read/write
commands are issued. At auto precharge completion, the specified
bank is switched from active to idle state. Note that no new commands
(RD/WR/DEAC) can be issued to the same bank until the specified
bank achieves the idle state. Auto precharge does not work with full-
page burst.
When CKE is low, the internal clock is frozen or suspended from the
next clock cycle and the state of the output and burst address are
Clock suspend/power
down mode entry
CKE = low
frozen. If both banks are idle and CKE goes low, the SDRAM enters
power down mode at the next clock cycle. When in power down
mode, no input commands are acknowledged as long as CKE remains
low. To exit power down mode, raise CKE high before the rising edge
of CLK.
Clock suspend/power
down mode exit
CKE = high
Resume internal clock operation by asserting CKE high before the
rising edge of CLK. Subsequent commands can be issued one clock
cycle after the end of the Exit command.
DataShee
DataSheet4U.com
5/21/01; v.1.1
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Alliance Semiconductor
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