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PDF MCP3201 Data sheet ( Hoja de datos )

Número de pieza MCP3201
Descripción 2.7V 12-Bit A/D Converter with SPI Serial Interface
Fabricantes Microchip Technology 
Logotipo Microchip Technology Logotipo



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MCP3201
2.7V 12-Bit A/D Converter with SPISerial Interface
Features
• 12-bit resolution
• ±1 LSB max DNL
• ±1 LSB max INL (MCP3201-B)
• ±2 LSB max INL (MCP3201-C)
• On-chip sample and hold
• SPIserial interface (modes 0,0 and 1,1)
• Single supply operation: 2.7V - 5.5V
• 100ksps max. sampling rate at VDD = 5V
• 50ksps max. sampling rate at VDD = 2.7V
• Low power CMOS technology
• 500 nA typical standby current, 2 µA max.
• 400 µA max. active current at 5V
• Industrial temp range: -40°C to +85°C
• 8-pin MSOP, PDIP, SOIC and TSSOP packages
Applications
• Sensor Interface
• Process Control
• Data Acquisition
• Battery Operated Systems
Description
The Microchip Technology Inc. MCP3201 is a succes-
sive approximation 12-bit Analog-to-Digital (A/D) Con-
verter with on-board sample and hold circuitry. The
device provides a single pseudo-differential input. Dif-
ferential Nonlinearity (DNL) is specified at ±1 LSB, and
Integral Nonlinearity (INL) is offered in ±1 LSB
(MCP3201-B) and ±2 LSB (MCP3201-C) versions.
Communication with the device is done using a simple
serial interface compatible with the SPI protocol. The
device is capable of sample rates of up to 100 ksps at
a clock rate of 1.6 MHz. The MCP3201 operates over
a broad voltage range (2.7V - 5.5V). Low current
design permits operation with typical standby and
active currents of only 500 nA and 300 µA, respec-
tively. The device is offered in 8-pin MSOP, PDIP,
TSSOP and 150 mil SOIC packages.
Package Types
MSOP, PDIP, SOIC, TSSOP
VREF
IN+
IN–
VSS
1
2
3
4
8 VDD
7 CLK
6 DOUT
5 CS/SHDN
Functional Block Diagram
VREF
VDD VSS
IN+ Sample
and
IN- Hold
DAC
Comparator
12-Bit SAR
Control Logic
Shift
Register
CS/SHDN CLK
DOUT
© 2007 Microchip Technology Inc.
DS21290D-page 1

1 page




MCP3201 pdf
MCP3201
2.0 TYPICAL PERFORMANCE CHARACTERISTICS
Note:
The graphs provided following this note are a statistical summary based on a limited number of samples
and are provided for informational purposes only. The performance characteristics listed herein are not
tested or guaranteed. In some graphs, the data presented may be outside the specified operating range
(e.g., outside specified power supply range) and therefore outside the warranted range.
Note: Unless otherwise indicated, VDD = VREF = 5V, VSS = 0V, fSAMPLE = 100 ksps, fCLK = 16*fSAMPLE,TA = 25°C
1.0
0.8
0.6
0.4
0.2
0.0
-0.2
-0.4
-0.6
-0.8
-1.0
0
Positive INL
Negative INL
25 50 75 100 125 150
Sample Rate (ksps)
FIGURE 2-1: Integral Nonlinearity (INL) vs. Sample
Rate.
2.0
1.5 VDD = VREF = 2.7V
1.0
Positive INL
0.5
0.0
-0.5
Negative INL
-1.0
-1.5
-2.0
0
20 40 60 80
Sample Rate (ksps)
100
FIGURE 2-4: Integral Nonlinearity (INL) vs. Sample
Rate (VDD = 2.7V).
2.0
1.5
1.0
Positive INL
0.5
0.0
-0.5 Negative INL
-1.0
-1.5
-2.0
01 23 45
VREF (V)
FIGURE 2-2: Integral Nonlinearity (INL) vs. VREF.
1.0
0.8
0.6
0.4
0.2
0.0
-0.2
-0.4
-0.6
-0.8
-1.0
0
512 1024 1536 2048 2560 3072 3584 4096
Digital Code
FIGURE 2-3: Integral Nonlinearity (INL) vs. Code
(Representative Part).
2.0
1.5
1.0
0.5
0.0
-0.5
-1.0
-1.5
-2.0
0.0
Positive INL
VDD = 2.7V
FSAMPLE = 50 ksps
Negative INL
0.5 1.0 1.5 2.0 2.5 3.0
VREF (V)
FIGURE 2-5: Integral Nonlinearity (INL) vs. VREF
(VDD = 2.7V).
1.0
0.8 VDD = VREF = 2.7V
0.6 FSAMPLE = 50 ksps
0.4
0.2
0.0
-0.2
-0.4
-0.6
-0.8
-1.0
0
512 1024 1536 2048 2560 3072 3584 4096
Digital Code
FIGURE 2-6: Integral Nonlinearity (INL) vs. Code
(Representative Part, VDD = 2.7V).
© 2007 Microchip Technology Inc.
DS21290D-page 5

5 Page





MCP3201 arduino
MCP3201
Note: Unless otherwise indicated, VDD = VREF = 5V, VSS = 0V, fSAMPLE = 100 ksps, fCLK = 16*fSAMPLE,TA = 25°C
80
70 VREF = CS = VDD
60
50
40
30
20
10
0
2.0 2.5 3.0 3.5 4.0 4.5 5.0 5.5 6.0
VDD (V)
FIGURE 2-37: IDDS vs. VDD.
100.00
10.00
VDD = VREF = CS = 5V
1.00
2.0
1.8 VDD = VREF = 5V
1.6 FCLK = 1.6 MHz
1.4
1.2
1.0
0.8
0.6
0.4
0.2
0.0
-50
-25
0
25 50 75 100
Temperature (°C)
FIGURE 2-39: Analog Input Leakage Current vs.
Temperature.
0.10
0.01
-50
-25
0 25 50
Temperature (°C)
75 100
FIGURE 2-38: IDDS vs. Temperature.
© 2007 Microchip Technology Inc.
DS21290D-page 11

11 Page







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