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Teilenummer | SMP100LC-8 |
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Beschreibung | TELECOM EQUIPMENT PROTECTION: TRISIL | |
Hersteller | STMicroelectronics | |
Logo | ||
Gesamt 9 Seiten ® SMP100LC-xxx
TELECOM EQUIPMENT PROTECTION: TRISIL™
FEATURES
s Bidirectional crowbar protection
s Voltage range from 8V to 262V
s Low capacitance from 30 pF to 45pF typ @ 50V
s Low leakage current : IR = 2 µA max
s Holding current: IH = 150 mA min
s Repetitive peak pulse current :
IPP = 100 A (10/1000µs)
MAIN APPLICATIONS
Any sensitive equipment requiring protection
against lightning strikes and power crossing:
s Analog and digital line cards
(xDSL, T1/ E1, ISDN...)
s Terminals (phone, fax, modem...) and central of-
fice equipment
SMB
(JEDEC DO-214AA)
SCHEMATIC DIAGRAM
DESCRIPTION
The SMP100LC-xxx series is a low
capacitance transient surge arrestor designed
for the protection of high debit rate
communication equipment. Its low capacitance
avoids any distortion of the signal and is
compatible with digital line cards (xDSL,
T1/E1, ISDN...).
BENEFITS
Trisils are not subject to ageing and provide a fail safe mode in short circuit for a better protection. They are
used to help equipment to meet main standards such as UL1950, IEC950 / CSA C22.2 and UL1459. They
have UL94 V0 approved resin. SMB package is JEDEC registered (DO-214AA). Trisils are UL497B
approved (file: E136224) and comply with the following standards GR-1089 Core, ITU-T-K20/K21,
VDE0433, VDE0878, IEC61000-4-5 and FCC part 68.
July 2002 - Ed: 8C
1/8
TEST CIRCUIT 2 FOR IBO and VBO parameters :
K
ton = 20ms
220V 50Hz
Vout
R1 = 140Ω
R2 = 240Ω
DUT
1/4
TEST PROCEDURE :
Pulse test duration (tp = 20ms):
- For Bidirectional devices = Switch K is closed
- For Unidirectional devices = Switch K is open.
VOUT Selection
- Device with VBO < 200 Volt
- VOUT = 250 VRMS, R1 = 140 Ω.
- Device with VBO ≥ 200 Volt
- VOUT = 480 VRMS, R2 = 240 Ω.
IBO
measurement
SMP100LC-xxx
VBO
measurement
TEST CIRCUIT 3 FOR IH PARAMETER
R
VBAT = - 48 V
D.U.T
Surge generator
This is a GO-NO GO test which allows to confirm the holding current (IH) level in a functional test circuit.
TEST PROCEDURE :
- Adjust the current level at the IH value by short circuiting the D.U.T.
- Fire the D.U.T. with a surge current : Ipp = 10A, 10/1000 µs.
- The D.U.T. will come back to the off-state within 50 ms max.
6/8
6 Page | ||
Seiten | Gesamt 9 Seiten | |
PDF Download | [ SMP100LC-8 Schematic.PDF ] |
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