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PDF FDD3672 Data sheet ( Hoja de datos )

Número de pieza FDD3672
Descripción N-Channel UltraFET Trench MOSFET 100V/ 44A/ 28m
Fabricantes Fairchild Semiconductor 
Logotipo Fairchild Semiconductor Logotipo



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No Preview Available ! FDD3672 Hoja de datos, Descripción, Manual

June 2002
FDD3672
N-Channel UltraFET® Trench MOSFET
100V, 44A, 28m
Features
• rDS(ON) = 24m(Typ.), VGS = 10V, ID = 44A
• Qg(tot) = 24nC (Typ.), VGS = 10V
• Low Miller Charge
• Low Qrr Body Diode
• Optimized efficiency at high frequencies
• UIS Capability (Single Pulse and Repetitive Pulse)
• Qualified to AEC Q101
Applications
DC/DC converters and Off-Line UPS
Distributed Power Architectures and VRMs
Primary Switch for 24V and 48V Systems
High Voltage Synchronous Rectifier
Direct Injection / Diesel Injection System
42V Automotive Load Control
Formerly developmental type 82760
Electronic Valve Train System
GATE
DRAIN
(FLANGE)
SOURCE
TO-252AB
FDD SERIES
MOSFET Maximum Ratings TC = 25°C unless otherwise noted
Symbol
VDSS
VGS
ID
EAS
PD
TJ, TSTG
Parameter
Drain to Source Voltage
Gate to Source Voltage
Drain Current
Continuous (TC = 25oC, VGS = 10V)
Continuous (TC = 100oC, VGS = 10V)
Continuous (Tamb = 25oC, VGS = 10V, RθJA = 52oC/W)
Pulsed
Single Pulse Avalanche Energy (Note 1)
Power dissipation
Derate above 25oC
Operating and Storage Temperature
Thermal Characteristics
RθJC
RθJA
RθJA
Thermal Resistance Junction to Case TO-252
Thermal Resistance Junction to Ambient TO-252
Thermal Resistance Junction to Ambient TO-252, 1in2 copper pad area
D
G
S
Ratings
100
±20
44
31
6.5
Figure 4
120
135
0.9
-55 to 175
1.11
100
52
Units
V
V
A
A
A
A
mJ
W
W/oC
oC
oC/W
oC/W
oC/W
This product has been designed to meet the extreme test conditions and environment demanded by the automotive industry. For a
copy of the requirements, see AEC Q101 at: http://www.aecouncil.com/
Reliability data can be found at: http://www.fairchildsemi.com/products/discrete/reliability/index.html.
All Fairchild Semiconductor products are manufactured, assembled and tested under ISO9000 and QS9000 quality systems
certification.
©2002 Fairchild Semiconductor Corporation
FDD3672 Rev. A

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FDD3672 pdf
Typical Characteristics TC = 25°C unless otherwise noted
1.2
ID = 250µA
1.1
3000
1000
COSS CDS + CGD
CRSS = CGD
100
1.0
CISS = CGS + CGD
0.9
-80
-40 0 40 80 120 160
TJ, JUNCTION TEMPERATURE (oC)
200
Figure 11. Normalized Drain to Source
Breakdown Voltage vs Junction Temperature
VGS = 0V, f = 1MHz
10
0.1
1 10
VDS, DRAIN TO SOURCE VOLTAGE (V)
100
Figure 12. Capacitance vs Drain to Source
Voltage
10
VDD = 50V
8
6
4
2
WAVEFORMS IN
DESCENDING ORDER:
ID = 44A
ID = 21A
0
0 5 10 15 20 25
Qg, GATE CHARGE (nC)
Figure 13. Gate Charge Waveforms for Constant Gate Currents
©2002 Fairchild Semiconductor Corporation
FDD3672 Rev. A

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FDD3672 arduino
TRADEMARKS
The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is
not intended to be an exhaustive list of all such trademarks.
ACEx
FRFET
PACMAN
SuperSOT-3
Bottomless
CoolFET
CROSSVOLT
DOME
GlobalOptoisolator
GTO
HiSeC
I2C
POP
Power247
PowerTrench®
QFET
SuperSOT-6
SuperSOT-8
SyncFET
TinyLogic
EcoSPARK
E2CMOS
EnSigna
FACT
FACT Quiet Series
FAST®
ISOPLANAR
LittleFET
MicroFET
MicroPak
MICROWIRE
OPTOLOGIC®
QS
QT Optoelectronics
Quiet Series
SILENT SWITCHER®
SMART START
SPM
TruTranslation
UHC
UltraFET®
VCX
FASTr
OPTOPLANAR
Stealth
DISCLAIMER
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY
PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY
LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN;
NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS.
LIFE SUPPORT POLICY
FAIRCHILDS PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR
CORPORATION.
As used herein:
2. A critical component is any component of a life support
1. Life support devices or systems are devices or systems device or system whose failure to perform can be
which, (a) are intended for surgical implant into the body, reasonably expected to cause the failure of the life support
or (b) support or sustain life, or (c) whose failure to perform device or system, or to affect its safety or effectiveness.
when properly used in accordance with instructions for use
provided in the labeling, can be reasonably expected to
result in significant injury to the user.
PRODUCT STATUS DEFINITIONS
Definition of Terms
Datasheet Identification
Advance Information
Product Status
Formative or In
Design
Preliminary
First Production
No Identification Needed
Full Production
Definition
This datasheet contains the design specifications for
product development. Specifications may change in
any manner without notice.
This datasheet contains preliminary data, and
supplementary data will be published at a later date.
Fairchild Semiconductor reserves the right to make
changes at any time without notice in order to improve
design.
This datasheet contains final specifications. Fairchild
Semiconductor reserves the right to make changes at
any time without notice in order to improve design.
Obsolete
Not In Production
This datasheet contains specifications on a product
that has been discontinued by Fairchild semiconductor.
The datasheet is printed for reference information only.
©2002 Fairchild Semiconductor Corporation
Rev. H7

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