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PDF AD590 Data sheet ( Hoja de datos )
| Número de pieza | AD590 | |
| Descripción | 2-Wire/ Current Output Temperature Transducer | |
| Fabricantes | Intersil Corporation | |
| Logotipo |  |
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 1. - Current Output Temperature Transducer  Hay una vista previa y un enlace de descarga de AD590 (archivo pdf) en la parte inferior de esta página. Total 10 Páginas | ||
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AD590
August 1997
2-Wire, Current Output
Temperature Transducer
Features
• Linear Current Output . . . . . . . . . . . . . . . . . . . . 1µA/oK
• Wide Temperature Range . . . . . . . . . . . -55oC to 150oC
• Two-Terminal Device Voltage In/Current Out
• Wide Power Supply Range . . . . . . . . . . . . . +4V to +30V
• Sensor Isolation From Case
• Low Cost
Ordering Information
NON-
PART LINEARITY TEMP. RANGE
NUMBER
(oC)
(oC)
PACKAGE
PKG.
NO.
AD590IH
±3.0
-55 to 150 3 Ld Metal Can T3.A
(TO-52)
AD590JH
±1.5
-55 to 150 3 Ld Metal Can T3.A
(TO-52)
Description
The AD590 is an integrated-circuit temperature transducer
which produces an output current proportional to absolute tem-
perature. The device acts as a high impedance constant current
regulator, passing 1µA/oK for supply voltages between +4V and
+30V. Laser trimming of the chip's thin film resistors is used to
calibrate the device to 298.2µA output at 298.2oK (25oC).
The AD590 should be used in any temperature-sensing
application between -55oC to 150oC in which conventional
electrical temperature sensors are currently employed. The
inherent low cost of a monolithic integrated circuit combined
with the elimination of support circuitry makes the AD590 an
attractive alternative for many temperature measurement sit-
uations. Linearization circuitry, precision voltage amplifiers,
resistance measuring circuitry and cold junction compensa-
tion are not needed in applying the AD590. In the simplest
application, a resistor, a power source and any voltmeter can
be used to measure temperature.
In addition to temperature measurement, applications include
temperature compensation or correction of discrete
components, and biasing proportional to absolute temperature.
The AD590 is particularly useful in remote sensing applica-
tions. The device is insensitive to voltage drops over long
lines due to its high-impedance current output. Any well
insulated twisted pair is sufficient for operation hundreds of
feet from the receiving circuitry. The output characteristics
also make the AD590 easy to multiplex: the current can be
switched by a CMOS multiplexer or the supply voltage can
be switched by a logic gate output.
Pinout
AD590
(METAL CAN)
+1
3 CASE
-2
Functional Diagram
+
Q2
Q1
Q6
Q7
R1 260Ω R2 1040Ω
Q5 Q3
Q4
Q12 Q8
C1 26pF
CHIP
SUBSTRATE
R3 5kΩ R4 11kΩ
Q9
8
R6 820Ω
Q10
1
R5 146Ω
Q11
1
-
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
http://www.intersil.com or 407-727-9207 | Copyright © Intersil Corporation 1999
12-3
File Number 3171.1
1 page  
AD590
J Grade Maximum Errors (oC)
NUMBER OF
TRIMS
TEMPERATURE
SPAN (oC)
None
10
None
25
None
50
None
100
None
150
None
205
One 10
One 25
One 50
One 100
One 150
One 205
Two 10
Two 25
Two 50
Two 100
Two 150
Two 205
NOTE:
10. Less than ±0.05oC.
LOWEST TEMPERATURE IN SPAN (oC)
-55 -25 0 25 50 75 100 125
4.2 4.6 5.0 5.4 5.8 6.2 6.6 7.2
5.0 5.2 5.5 5.9 6.0 6.9 7.5 8.0
6.5 6.5 6.4 6.9 7.3 8.2 9.0
-
7.7 8.0 8.3 8.7 9.4
-
-
-
9.2 9.5 9.6
-
-
-
-
-
10.0 - - - - - - -
0.3 0.2 0.2 0.2 0.2 0.2 0.2 0.3
0.9 0.6 0.5 0.5 0.5 0.6 0.8 0.9
1.9 1.5 1.0 1.0 1.0 1.5 1.9
-
2.3 2.2 2.0 2.0 2.3
-
-
-
2.5 2.4 2.5
-
-
-
-
-
3.0 - - - - - - -
0.1 (Note 10) (Note 10) (Note 10) (Note 10) (Note 10) (Note 10) 0.1
0.2 0.1 (Note 10) (Note 10) (Note 10) (Note 10) 0.1 0.2
0.4 0.2 0.1 (Note 10) (Note 10) 0.1 0.2 (Note 10)
0.7 0.5 0.3 0.7 1.0
-
-
-
1.0 0.7 1.2
-
-
-
-
-
1.6 - - - - - - -
NOTES
1. Maximum errors over all ranges are guaranteed based on
the known behavior characteristic of the AD590.
2. For one-trim accuracy specifications, the 205oC span is
assumed to be trimmed at 25oC; for all other spans, it is
assumed that the device is trimmed at the midpoint.
3. For the 205oC span, it is assumed that the two-trim
temperatures are in the vicinity of 0oC and 140oC; for all
other spans, the specified trims are at the endpoints.
4. In precision applications, the actual errors encountered
are usually dependent upon sources of error which are
often overlooked in error budgets. These typically
include:
a. Trim error in the calibration technique used
b. Repeatability error
c. Long term drift errors
Trim Error is usually the largest error source. This error
arises from such causes as poor thermal coupling between
the device to be calibrated and the reference sensor; refer-
ence sensor errors; lack of adequate time for the device
being calibrated to settle to the final temperature; radically
different thermal resistances between the case and the sur-
roundings (RθCA) when trimming and when applying the
device.
Repeatability Errors arise from a strain hysteresis of the
package. The magnitude of this error is solely a function of
the magnitude of the temperature span over which the
device is used. For example, thermal shocks between 0oC
and 100oC involve extremely low hysteresis and result in
repeatability errors of less than ±0.05oC. When the thermal-
shock excursion is widened to -55oC to 150oC, the device
will typIcally exhibit a repeatability error of ±0.05oC (±0.10
guaranteed maximum).
Long Term Drift Errors are related to the average operating
temperature and the magnitude of the thermal-shocks
experienced by the device. Extended use of the AD590 at
temperatures above 100oC typically results in long-term drift
of ±0.03oC per month; the guaranteed maximum is ±0.10oC
per month. Continuous operation at temperatures below
100oC induces no measurable drifts in the device. Besides
the effects of operating temperature, the severity of thermal
shocks incurred will also affect absolute stability. For
thermal-shock excursions less than 100oC, the drift is diffi-
cult to measure (<0.03oC). However, for 200oC excursions,
the device may drift by as much as ±0.10oC after twenty
such shocks. If severe, quick shocks are necessary in the
application of the device, realistic simulated life tests are rec-
ommended for a thorough evaluation of the error introduced
by such shocks.
12-7
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